Nanometer-scale Defect Detection Using Polarized Light

By Abdelkhalak El Hami, Philippe Pougnet, Pierre-Richard Dahoo | Publisher: Wiley

About the book

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

Editions of Nanometer-scale Defect Detection Using Polarized Light

Hardcover
ISBN 9781848219366
EBook
ISBN 9781119329688
EBook
ISBN 9781119329633
EBook
ISBN 9781119329657

Read an Excerpt

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

Frequently Asked Questions

What is Nanometer-scale Defect Detection Using Polarized Light about?

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

What core themes, tropes, or subjects are explored in Nanometer-scale Defect Detection Using Polarized Light?

Technology, Engineering, Agriculture, Industrial processes > Technology: general issues > Nanotechnology

Where can I read a sample of Nanometer-scale Defect Detection Using Polarized Light?

You can read an official preview of the few pages here https://www.book2look.com/book/9781848219366

Who is/are the Author/s of the book Nanometer-scale Defect Detection Using Polarized Light?

Abdelkhalak El Hami, Philippe Pougnet, Pierre-Richard Dahoo

Who is the Publisher of the book Nanometer-scale Defect Detection Using Polarized Light?

Wiley

What are the ISBN numbers for the physical and digital editions?

Nanometer-scale Defect Detection Using Polarized Light is available as hardcover(ISBN 9781848219366) and ebook(ISBN 9781119329688) and ebook(ISBN 9781119329633) and ebook(ISBN 9781119329657)

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