Transmission Electron Microscopy in Micro-nanoelectronics, , Wiley, Alain Claverie,Electronic devices and materials,Electronics engineering, introduction; holography; dopant; cooper; david; offaxis electron; tem; phase; basics; images; electron waves; fields; electromagnetic; measurement; electron; electron holograms; biprism; electron biprism; experimental electron,, , United States, en-UShttps://www.wiley.comintroduction; holography; dopant; cooper; david; offaxis electron; tem; phase; basics; images; electron waves; fields; electromagnetic; measurement; electron; electron holograms; biprism; electron biprism; experimental electron, [BLURB],[CITY],,books, ebooks, biblet, Book2look