Reliability Wearout Mechanisms in Advanced CMOS Technologies, , Wiley, Alvin W. Strong, Ernest Y. Wu, Giuseppe La Rosa, Jordi Sune, Rolf-Peter Vollertsen, Stewart E. Rauch, Timothy D. Sullivan,Electrical engineering,Energy technology and engineering, CMOS technology reliability; failure mechanisms; reliability testing; reliability analysis; semiconductor technology; technology reliability; reliability wearout mechanisms; Reliability for CMOS; Reliability for VLSI; Reliability for ULSI; CMOS reliability; VLSI reliability; ULSI reliability; Dielectric Reliability Device Reliability; Interconnect Reliability; ieee; ieee series; ieee book; guidebook for managing silicon chip reliability; oxide reliability,, IEEE Press Series on Microelectronic Systems, United States, en-UShttps://www.wiley.comCMOS technology reliability; failure mechanisms; reliability testing; reliability analysis; semiconductor technology; technology reliability; reliability wearout mechanisms; Reliability for CMOS; Reliability for VLSI; Reliability for ULSI; CMOS reliability; VLSI reliability; ULSI reliability; Dielectric Reliability Device Reliability; Interconnect Reliability; ieee; ieee series; ieee book; guidebook for managing silicon chip reliability; oxide reliability, [BLURB],[CITY],,books, ebooks, biblet, Book2look