Single Event Effects in Aerospace, , Wiley, Edward Petersen,Electronic devices and materials,Electronics engineering, Cross Sections; Heavy Ions; Rate Predictions; Semiconductor device radiation effects; Single event characterization; Single event charge collection; Single Event Effect (SEE); Single event mechanisms; Single event Modeling; Single event upset; Soft error rate; Soft errors; Space Environment,, , United States, en-UShttps://www.wiley.comCross Sections; Heavy Ions; Rate Predictions; Semiconductor device radiation effects; Single event characterization; Single event charge collection; Single Event Effect (SEE); Single event mechanisms; Single event Modeling; Single event upset; Soft error rate; Soft errors; Space Environment, [BLURB],[CITY],,books, ebooks, biblet, Book2look